ELEX 3
問題一覧
1
0.90, 0.998
2
temperature
3
Active
4
high input impedance and low voltage gain
5
R1, R2, C1, and C2
6
4
7
coercive force
8
Power
9
6.25% of full scale
10
both holes and electrons
11
BiCMOS
12
opposes the input signal
13
bypass capacitor
14
inclusive OR
15
Thick Film
16
output capacitance of the load gate
17
1.125
18
nonlinear
19
110.1100
20
1/3
21
Register
22
Fundamental
23
5 ms
24
Clipper
25
biasing conditions will change
26
ECL is faster
27
0.1 µ
28
unacceptable
29
DRAMs must be periodically refreshed.
30
A battery is a closed system.
31
geometric average of the critical frequencies
32
1.4 pJ
33
Tetrode
34
(G3(G1 G2 + 1))/(1 + G1 H1)
35
Multiplexing
36
It is high pass filter.
37
current series
38
Schottky Diode
39
Orange, White, Red, Gold
40
by forced commutation.
41
RAM
42
diode is open circuited.
43
They are of same value.
44
either diode or BJT
45
2 ms
46
replace all calculated voltages and currents by reverse values.
47
4
48
Germanium
49
noise sensitivity
50
memory that retains stored information when electrical power is removed.
51
Series
52
Small duration and can be positive or negative
53
negative gate voltages
54
200 n
55
Wein Bridge Oscillator
56
Class C
57
200,000
58
R2 shorts
59
The output of the gate appears to be open.
60
10k Ohm
61
its filter efficiency
62
about 80 V
63
switch, piezo, coil
64
reverse, forward
65
Pits
66
holes and electrons
67
less
68
BC
69
conductivity decreases with increase in temperature
70
higher than hole mobility
71
2.5 V
72
Tunnel Diode
73
reducing the switching time
74
will decrease by an approximate factor of about 2
75
Tunnel Diode
76
the width of depletion layer decreases
77
immobile charges
78
False
79
more than
80
slightly conducting
81
recombination in base region is minimum
82
almost flat
83
the forbidden energy gap in silicon and germanium decreases
84
increases
85
MOSFET
86
wavelength of incident radiation is less than threshold value
87
False
88
is less than 1 but more than 0.9
89
PIN Diode
90
(1/2)mv² ≤ hf - Uw
91
False
92
less than I
93
decreases
94
electron hole pairs
95
2, 4, 5
96
photo resistive device
97
tuning
98
True
99
more than
100
very high
Basic Communication I
Basic Communication I
John Cerda · 100問 · 2年前Basic Communication I
Basic Communication I
100問 • 2年前Basic Communication II
Basic Communication II
John Cerda · 100問 · 2年前Basic Communication II
Basic Communication II
100問 • 2年前Basic Communication III
Basic Communication III
John Cerda · 50問 · 2年前Basic Communication III
Basic Communication III
50問 • 2年前Amplitude Modulation I
Amplitude Modulation I
John Cerda · 100問 · 2年前Amplitude Modulation I
Amplitude Modulation I
100問 • 2年前Amplitude Modulation II
Amplitude Modulation II
John Cerda · 100問 · 2年前Amplitude Modulation II
Amplitude Modulation II
100問 • 2年前Angle Modulation I
Angle Modulation I
John Cerda · 100問 · 2年前Angle Modulation I
Angle Modulation I
100問 • 2年前Angle Modulation II
Angle Modulation II
John Cerda · 58問 · 2年前Angle Modulation II
Angle Modulation II
58問 • 2年前Transmission Line I
Transmission Line I
John Cerda · 100問 · 2年前Transmission Line I
Transmission Line I
100問 • 2年前Transmission Line II
Transmission Line II
John Cerda · 37問 · 2年前Transmission Line II
Transmission Line II
37問 • 2年前Differential Calculus
Differential Calculus
John Cerda · 84問 · 2年前Differential Calculus
Differential Calculus
84問 • 2年前Integral Calculus
Integral Calculus
John Cerda · 53問 · 2年前Integral Calculus
Integral Calculus
53問 • 2年前DC Circuit
DC Circuit
John Cerda · 63問 · 2年前DC Circuit
DC Circuit
63問 • 2年前Differential Equation
Differential Equation
John Cerda · 21問 · 2年前Differential Equation
Differential Equation
21問 • 2年前ELEX 2
ELEX 2
John Cerda · 100問 · 2年前ELEX 2
ELEX 2
100問 • 2年前ELEX 4
ELEX 4
John Cerda · 100問 · 2年前ELEX 4
ELEX 4
100問 • 2年前ELEX 5
ELEX 5
John Cerda · 59問 · 2年前ELEX 5
ELEX 5
59問 • 2年前MATH
MATH
John Cerda · 78問 · 2年前MATH
MATH
78問 • 2年前問題一覧
1
0.90, 0.998
2
temperature
3
Active
4
high input impedance and low voltage gain
5
R1, R2, C1, and C2
6
4
7
coercive force
8
Power
9
6.25% of full scale
10
both holes and electrons
11
BiCMOS
12
opposes the input signal
13
bypass capacitor
14
inclusive OR
15
Thick Film
16
output capacitance of the load gate
17
1.125
18
nonlinear
19
110.1100
20
1/3
21
Register
22
Fundamental
23
5 ms
24
Clipper
25
biasing conditions will change
26
ECL is faster
27
0.1 µ
28
unacceptable
29
DRAMs must be periodically refreshed.
30
A battery is a closed system.
31
geometric average of the critical frequencies
32
1.4 pJ
33
Tetrode
34
(G3(G1 G2 + 1))/(1 + G1 H1)
35
Multiplexing
36
It is high pass filter.
37
current series
38
Schottky Diode
39
Orange, White, Red, Gold
40
by forced commutation.
41
RAM
42
diode is open circuited.
43
They are of same value.
44
either diode or BJT
45
2 ms
46
replace all calculated voltages and currents by reverse values.
47
4
48
Germanium
49
noise sensitivity
50
memory that retains stored information when electrical power is removed.
51
Series
52
Small duration and can be positive or negative
53
negative gate voltages
54
200 n
55
Wein Bridge Oscillator
56
Class C
57
200,000
58
R2 shorts
59
The output of the gate appears to be open.
60
10k Ohm
61
its filter efficiency
62
about 80 V
63
switch, piezo, coil
64
reverse, forward
65
Pits
66
holes and electrons
67
less
68
BC
69
conductivity decreases with increase in temperature
70
higher than hole mobility
71
2.5 V
72
Tunnel Diode
73
reducing the switching time
74
will decrease by an approximate factor of about 2
75
Tunnel Diode
76
the width of depletion layer decreases
77
immobile charges
78
False
79
more than
80
slightly conducting
81
recombination in base region is minimum
82
almost flat
83
the forbidden energy gap in silicon and germanium decreases
84
increases
85
MOSFET
86
wavelength of incident radiation is less than threshold value
87
False
88
is less than 1 but more than 0.9
89
PIN Diode
90
(1/2)mv² ≤ hf - Uw
91
False
92
less than I
93
decreases
94
electron hole pairs
95
2, 4, 5
96
photo resistive device
97
tuning
98
True
99
more than
100
very high